Antenna Pattern Comparison of a Microstrip Antenna on a Finite Substrate Using Near-Field Measurement and FEKO
Masanobu Hirose, Koji Komiyama and Takauki Ishizone*
National Metrology Institute of Japan; *Dept. of Electrical and Electronic Engineering, Toyo University, Japan
We have measured the antenna pattern of a linearly polarized microstrip antenna on a finite substrate (3.9 wavelength square) and compared it with the calculated one using FEKO (a commercial software). We have obtained the pattern using spherical near-field measurement where a photonic sensor is used as a probe. The photonic sensor can be considered to be an ideal probe for near-field measurements because its size is a few mm, or less than 0.1 wavelength below 12 GHz. To validate the assumption, we have compared the measured pattern with the calculated one using FEKO that is based on the method of moments with RGW basis functions. As a result, the measured pattern agrees within 2 dB in the main beam.
20th Annual Review of Progress in Applied Computational Electromagnetics
2004
April
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