OEWG Probe Pattern Comparisons between NPL Measurements, EM-Model and Analytical Model
Chris Dempsey
Northrop Grumman Corporation
This paper compares 3 sets of far-field patterns of an S-Band Open Ended Waveguide (OEWG). The sources for the data are measurements from NPL, an EM-Model and the commonly used NIST analytical model. Both co-polarized (co-pol) and cross-polarized (x-pol) patterns are compared. Results indicate that accuracy improvements are possible by utilizing an EM-Model in certain applications. These applications as well as the pros and cons of doing this are discussed. Understanding the differences between these 3 independent sets of data enables near-field range engineers to better understand the directional dependence of probe correction accuracies over the majority of the forward hemisphere. Information and insight gained from this comparison, along with specific AUT requirements, better equips the near-field range user to address probe correction concerns and ultimately to determine if a calibrated probe solution is required for their unique testing scenario.
Proc. AMTA
2011
October
287-292
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